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WHAT'S NEW


Features Added in SpeCLED + RATRO 2008

Image Gallery

die geometry

Figure 1 3D View Mode in SpeCLED GUI provides intuitive visualization of the specified die geometry, including the substrate

SpeCLED 2008 and RATRO 2008 have been radically modified compared to SpeCLED 3.0 with RATRO 1.2. Detailed description of the operation with SpeCLED 2008 and RATRO 2008 can be found in the SpeCLED 2008 Getting Started, SpeCLED 2008 Getting Started and SpeCLED - RATRO Graphical User Interface Reference Guide documents. The main new features are listed below in brief.


vertical die substrate with p-Electrode

Figure 2 Schematic view of the vertical die substrate with p-Electrode.
Green: Substrate;
Read Cross: p-Electrode;
Small Brown Square: p-Pad.

Blocking Layer under the electrode matches the large red square

1. Support of New Die Elements in SpeCLED

  • Current ITO-like spreading layer placed on the p-contact layer is available.
  • Substrate was included into the computational domain. Current spreading and heat transfer in conducting substrates and heat transfer in insulating substrates are supported.
  • Electrode pads were included into the computational domain. Voltage drop inside the pads is taken into account.


Figure 3 Distribution of the vertical component of the current (mA) across the substrate section. Blocking layer is removed

2. Modification of the SpeCLED + RATRO Graphical User Interface

  • The way of specification of the die design was considerably modified (see SpeCLED - RATRO Graphical User Interface Reference Guide, sections Chip Configuration Dialog Window and Layers Tab Window).
  • Manual input of the active region properties was implemented (see SpeCLED -RATRO Graphical User Interface Reference Guide, section Manual Specification of I-V Characteristics)
  • Manual specification of the computational grid in vertical dimension was implemented (see SpeCLED -RATRO Graphical User Interface Reference Guide, section Chip Configuration Dialog Window).


Figure 4 Distribution of the vertical component of the current (mA) across the substrate section. Design with blocking layer at the center of the electrode

3. Support of New Options in RATRO

  • Stand-alone RATRO software tool now can be used without SpeCLED. Specification of the die geometry is made within RATRO graphical user interface. In this case uniform emission distribution from the active region is assumed.
  • New model of the die surfaces were implemented (see SpeCLED - RATRO Graphical User Interface Reference Guide, section RATRO Tab Window - Surface Models): a model of a multiple metal layer contacts to be applied to p- and n-electrodes. and a model of regularly patterned surfaces to be applied to free semiconductor or substrate surfaces.
  • Specification of wavelength dependence of refraction and absorption indices of the semiconductor, substrate and epoxy materials was implemented (see SpeCLED - RATRO Graphical User Interface Reference Guide, section RATRO Tab Window - Bulk Properties).
  • Light polarization model was implemented.
  • Both isotropic and Lambert laws of emission from the active region are supported.

For more detailed information see also History Notes for SpeCLED + RATRO 2008

 

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